Symposium 1: Advanced Structure Analysis and Characterization of Ceramic Materials
Scope:
Remarkable developments have been made recently in the structural analysis and characterization of inorganic crystalline and amorphous materials, such as X-ray, neutron, synchrotron and electron diffraction, x-ray/neutron scattering, IR/Raman scattering, NMR, XAFS, first-principle calculations, computer simulations, Rietveld analysis, the maximum-entropy method, in situ measurements at high temperatures/pressures and electron/nuclear density analysis. These techniques enable scientists to study not only static and long-range periodic structures but also dynamic and short-/intermediate-range structures. Multi-scale characterization from the electron to micrometer levels is becoming increasingly important as a means of understanding phenomena at the interfaces, grain boundaries and surfaces of ceramic materials. This symposium will discuss the structure/property relationships of various ceramic materials. (electro, magnetic and optical ceramics; energy and environment related ceramics; bio-ceramics; ceramics for reliability secure society; traditional ceramics). The proposed session topics include:
- X-ray, neutron, synchrotron and electron diffraction
- X-ray absorption fine structure (XAFS)
- Light scattering
- Computer simulation
- First-principles calculations
- Physico-chemical properties
- Structure-property relationships
- Crystal structure, glasses and amorphous materials,
- Nano-structure and micro-structure
- Interfaces, surfaces and grain boundaries.
Organizers:
Masatomo Yashima
Scott T. Misture
Xiaolong Chen
Takashi Ida
Isao Tanaka
Main Organizers
- Masatomo Yashima, Tokyo Institute of Technology, Japan
- Scott T. Misture, Alfred University, USA
Co-Organizers
- Xiaolong Chen, Institute of Physics, CAS, China
- Takashi Ida, Nagoya Institute of Technology, Japan
- Roman Shpanchenko, Moscow State University, Russia
- Isao Tanaka, Kyoto University, Japan